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  • Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.

Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.

Author List
Aberth WH, Burlingame AL
Publication
Analytical chemistry
Publication ID (Profile URL)
https://researcherprofiles.org/profile/1169874
Publication Year
1988
PubMed ID
3064656
Publication Title
Aberth WH, Burlingame AL. Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range. Anal Chem. 1988 Jul 15; 60(14):1426-8.